RELXILL is a brand new model, joining forces of the XILLVER reflection code (link; Garcia et al., 2010, 2011, 2013) and the RELLINE code (Dauser et al., 2010, 2013). The striking new feature is that for each point on the disk the proper xillver-reflection spectrum is chosen for each relativistically calculated emission angle. The implications of this improvement and more details regarding the model are provided in Garcia & Dauser et al (2014, accepted by ApJ, arXiv).
v0.1e: bug fixed: if fixRelRefl=1, the model was not always working properly
v0.1d: fixed minor bug when displaying the reflection fraction
v0.1c: added the possibility to fix and display the reflection fraction to the one predicted from the lamp post setup (applies only to relxilllp)
v0.1b: Major change to the structure of relxill.
- The table now includes a cutoff energy (Ecut). However, unfortunately this requires a larger table to be downloaded.
- The model is now evaluated on a fixed energy grid, yielding a huge improvement in speed for complicated datasets.
- We added the parameter "reflection fraction", with equal definition like in the pexrav model. Hence, for a positive value of this parameter, the primary power law and the reflection spectrum are returned (see below for more information)
By installing the new RELXILL model, all previous implementations of the relline-like and relconv-like models are automatically installed, too. These models are completely identical to the ones from the RELLINE installation (hence, no additional installation of relline is necessary to get the previous functionalities).
Usage and ParametersThe RELXILL model now includes by default the irradiating power law source. It's strength can be set by the parameter refl_frac. Note, however, that for a negative value of refl_frac, only the reflection compontent will be returned (equal to the pexrav model definition).
|norm:||defined as the normalization of xillver divided by the ionization parameter|
|refl_frac:||reflection fraction, with the same definition as pexrav; calculated between 20 and 40 keV|
|Ecut:||cutoff energy in keV (the same for the power law and the reflection spectrum)|
|angleon:||0: angle averaging (see below for more information)|
|1: take angles properly into account|
|fixReflFrac:||0: free reflection fraction (determined by the refl_frac parameter)|
|1: fix reflection fraction to the lamp post value (i.e., the parameter refl_frac has NO meaning in this case)|
|2: free, (same as 0:), but now the reflection fraction is displayed on the screen|
The meaning of the parameters is the same as for the separate models. The only exception is the additional parameter angleon. If set to 0, the relxill model acts like a simple RELCONV x XILLVER, hence using only the angle averaged reflection spectra and then applying the relativistic smear. However, if set to 1, it acts as described above: For each point on the disk the proper xillver-reflection spectrum is chosen for each relativistically calculated emission angle. Note that due to the relativistic effects the emission angle is generally not equal to the inclination angle and therefore this more complicated approach is necessary. Moreover, as the angular effects are properly treated, no "guess" regarding a limb brightening or darkening law is needed anymore. Hence, unless you really know what you are doing: Leave angleon=1. It is definitely the exacter model (no matter what your chi2 value is telling you)!
To install, please download the following files:
|last changes||in version|
|tables.fits.tgz (warning: 632MB)||2013-12-18||v0.1b|
The installation is similar to the relline model (look here). Note that you can use the environment variable RELLINE_TABLES to point to the complete set of provided tables, including the xillver table.
A Comparison between RELXILL and the angle averaged approach
The code here is still in BETA-test! Please contact me if you find bugs or encounter problems with the model.